Fix test flake in sysui test suite.

This code creates a timer 1 second in the future, which causes code to
run that has alredy been deconstructed, leading to an instrumentation
crash.

Fixes: 290111230
Test: atp v2/android-virtual-infra/test_mapping/presubmit-large-avd
Change-Id: Ibd786995cc6b8252aa5ce07d2aea5977ae2551db
Merged-In: Ibd786995cc6b8252aa5ce07d2aea5977ae2551db
(cherry picked from commit d0e22c52ed)
This commit is contained in:
Aaron Liu
2023-07-06 10:57:19 -07:00
parent ddb03a45b8
commit c95cbf9cde

View File

@@ -187,9 +187,7 @@ public class KeyguardAbsKeyInputViewControllerTest extends SysuiTestCase {
@Test
public void testLockedOut_verifyPasswordAndUnlock_doesNotEnableViewInput() {
mKeyguardAbsKeyInputViewController.handleAttemptLockout(
SystemClock.elapsedRealtime() + 1000);
mKeyguardAbsKeyInputViewController.verifyPasswordAndUnlock();
mKeyguardAbsKeyInputViewController.handleAttemptLockout(SystemClock.elapsedRealtime());
verify(mAbsKeyInputView).setPasswordEntryInputEnabled(false);
verify(mAbsKeyInputView).setPasswordEntryEnabled(false);
verify(mAbsKeyInputView, never()).setPasswordEntryInputEnabled(true);