Fix test flake in sysui test suite.
This code creates a timer 1 second in the future, which causes code to
run that has alredy been deconstructed, leading to an instrumentation
crash.
Fixes: 290111230
Test: atp v2/android-virtual-infra/test_mapping/presubmit-large-avd
Change-Id: Ibd786995cc6b8252aa5ce07d2aea5977ae2551db
Merged-In: Ibd786995cc6b8252aa5ce07d2aea5977ae2551db
(cherry picked from commit d0e22c52ed)
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@@ -187,9 +187,7 @@ public class KeyguardAbsKeyInputViewControllerTest extends SysuiTestCase {
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@Test
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public void testLockedOut_verifyPasswordAndUnlock_doesNotEnableViewInput() {
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mKeyguardAbsKeyInputViewController.handleAttemptLockout(
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SystemClock.elapsedRealtime() + 1000);
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mKeyguardAbsKeyInputViewController.verifyPasswordAndUnlock();
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mKeyguardAbsKeyInputViewController.handleAttemptLockout(SystemClock.elapsedRealtime());
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verify(mAbsKeyInputView).setPasswordEntryInputEnabled(false);
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verify(mAbsKeyInputView).setPasswordEntryEnabled(false);
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verify(mAbsKeyInputView, never()).setPasswordEntryInputEnabled(true);
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