1. Disable BatteryType section which is device-specific 2. Make timeout longer since meminfo section timedout in test 3. make some negative values sint 4. varint can be 64 bits, there is a bug implicitly convert it to 32 which loses values. 5. Found another bug which failed to read 64 bits varint, create a native test to make sure it works. Bug: 77291057 Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
incidentd
How to build, deploy, unit test
For the first time, build the test and create an empty directly on device:
root$ make -j incidentd_test && adb shell mkdir /data/nativetest/incidentd_test
Run the test on a device manually
root$ mmm -j frameworks/base/cmds/incidentd && \
adb push $OUT/data/nativetest/incidentd_test/* /data/nativetest/ && \
adb shell /data/nativetest/incidentd_test 2>/dev/null
Run the test via AndroidTest.xml
root$ atest incidentd_test
Use clang-format to style the file
clang-format -style=file -i