ad3e6e5d5a
1. Disable BatteryType section which is device-specific 2. Make timeout longer since meminfo section timedout in test 3. make some negative values sint 4. varint can be 64 bits, there is a bug implicitly convert it to 32 which loses values. 5. Found another bug which failed to read 64 bits varint, create a native test to make sure it works. Bug: 77291057 Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
26 lines
932 B
C++
26 lines
932 B
C++
// Copyright (C) 2018 The Android Open Source Project
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//
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// Licensed under the Apache License, Version 2.0 (the "License");
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// you may not use this file except in compliance with the License.
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// You may obtain a copy of the License at
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//
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// http://www.apache.org/licenses/LICENSE-2.0
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//
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// Unless required by applicable law or agreed to in writing, software
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// distributed under the License is distributed on an "AS IS" BASIS,
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// WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
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// See the License for the specific language governing permissions and
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// limitations under the License.
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#include <android/util/EncodedBuffer.h>
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#include <gmock/gmock.h>
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#include <gtest/gtest.h>
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using namespace android::util;
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TEST(EncodedBufferTest, ReadVarint) {
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EncodedBuffer buffer;
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uint64_t val = UINT64_C(1522865904593);
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buffer.writeRawVarint64(val);
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EXPECT_EQ(val, buffer.begin().readRawVarint());
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}
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